The DG5000 Pro fits up to 8 high-performance output channels into a standard chassis. Compared with a traditional stack of separate instruments, it frees as much as two-thirds of your valuable bench and rack space. This high-density design lets one unit replace a whole instrument suite, dramatically simplifying the setup and management of complex test systems.

In complex systems, signal integrity is vital. The DG5000 Pro uses a grouped-isolation scheme: channels are organized into 4 independent pairs (CH1/2, CH3/4, …). Each pair is fully isolated from the others and from the chassis, so ground-loop noise is eliminated when probing multiple circuits. Signals stay clean and safe, and the shared reference within each pair suits differential outputs, giving unmatched flexibility for mixed-signal tests.

Owing to RIGOL’s proprietary SiFi II high-fidelity signal technology, the DG5000 Pro holds jitter to an astonishing 200 ps. Every waveform edge remains rock-solid and razor-clean, delivering the timing accuracy you need—whether it serves as a clock source for a high-speed system or for any precision-timing test.

Engineered for modern power-semiconductor testing, the DG5000 Pro generates editable pulse trains of 2–30 pulses, enabling quick setup of double-pulse tests (DPT) and similar applications—an ideal tool for analyzing the dynamic behavior of devices like MOSFETs and IGBTs.

Equipped with a powerful multi-tone generator, it can effortlessly synthesize composite signals containing up to 16 tones, each with independently editable amplitude and phase. This capability makes it an efficient tool for analyzing intermodulation distortion and other nonlinear characteristics of amplifiers, filters, and similar devices.